4

A new method for on wafer noise measurement

Year:
1993
Language:
english
File:
PDF, 647 KB
english, 1993
7

Noise modeling in fully depleted SOI MOSFETs

Year:
2004
Language:
english
File:
PDF, 549 KB
english, 2004
8

Noise analysis in devices under nonlinear operation

Year:
1999
Language:
english
File:
PDF, 229 KB
english, 1999